Timevision Modules

A solution for constraints development and verification, allowing
system-on-chip (SoC) and integrated circuit (IC) developers to
make massive productivity gains across the design flow.

DESIGN-FOR-TEST (DFT)

Common DFT techniques like lockup latch insertion and test clock assignment are often very hard to verify and can cause late-stage impacts on functional modes of SoC designs. Timevision DFT helps analysis DFT logic and its intersection with functional timing, reducing late stage schedule impacts from DFT errors and related coverage escapes.

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